TT-Medal Publications
To see the abstracs of the publications, please click on the marked titles!
| Hannu Rytilä |
Making OBSAI Standard Better with formal test languages – Usage of TTCN-3 in testing of OBSAI Modules |
Presentation |
OBSAI |
Shanghai , China |
6.7.2004 |
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Presented |
| Ina Schieferdecker |
Eine TTCN-3 Testplattform für reaktive Systeme |
Presentation |
Forschungsoffensive "Software Engineering 2006, "Eröffnungskonferenz |
Berlin, Germany |
July 2004 |
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Presented |
| Annukka Mäntyniemi & Pekka Mäki-Asiala |
Improving Efficiency of Testing with Test Reuse |
Workshop paper |
3rd Software Product Line Conference (SPLC 2004) - Workshop on Quality Assurance in Reuse Contexts |
Boston , Massachusetts , USA |
August 30 – September 2, 2004 |
http://docserver.fhg.de/iese/2004/reports/096.pdf |
Fraunhofer IESE |
|
Published |
| Paul Baker, Zhen Ru Dai, Jens Grabowski, Øystein Haugen, Serge Lucio, Eric Samuelsson, Ina Schieferdecker, and Clay Williams |
The UML 2.0 Testing Profile |
Paper |
Conquest 2004 |
Nuremberg , Germany |
September 2004 |
Proceedings |
ASQF e.V. |
2004 |
Published |
| Alain Vouffo-Feudjio and Ina Schieferdecker |
Test Patterns with TTCN-3 |
Paper |
FATES 2004 |
Linz , Austria |
Linz , Austria |
Proceedings, LNCS |
Springer |
2005 |
Accepted |
| Colin Willcock |
Improved Testing with TTCN-3 |
Presentation |
5 th ITEA Symposium, workhsop on Innovation in Software Engineering |
Seville , Spain |
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| Hannu Rytilä |
SIP Service Testing for Mobile Clients - A Solution Using Simulated Network |
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Presentation |
NETS Results Promotion, Tekes |
Helsinki , Finland |
19.10.2004 |
http://oppimisteollisuus.evtek.fi/NETS/ |
Tekes |
2004 |
Presented |
| Ina Schieferdecker, George Din |
A Metamodel for TTCN-3 |
Paper |
ITM 2004 |
Toledo , Spain |
Oct. 2004 |
Proceedings, LNCS |
Springer |
2004 |
Published |
| Ina Schieferdecker |
The Testing and Test Control Notation TTCN-3 |
Presentation |
TIMNA 2004 |
Beijing , China |
Oct. 2004 |
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Presented |
| Ina Schieferdecker |
The UML 2.0 Testing Profile |
Presentation |
TIMNA 2004 |
Beijing , China |
Oct. 2004 |
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Presented |
| George Din, Justyna Zander, Stephan Pietsch |
Test exectution logging and visualization techniques |
Conference Paper |
Software & Systems Engineering and their Applications (ICSSEA04) |
Paris , France |
30.11.2004 |
CNAM |
ICSSEA Proceeding, ISSN 1637-5033 s |
2004 |
Published |
| M. Born, I. Schieferdecker, O. Kath and C. Hirai |
Combining System Development and System Test in a Model-centric Approach |
Paper |
RISE 2004 |
Luxembourg , Luxembourg |
Nov. 2004 |
Proceedings, LNCS |
Springer |
2005 |
Accepted |
| Juan Garbarjosa, Jorgen Boegh, Patricia Rodriguez-Dapena, Axel Rennoch |
Proceedings 3rd Workshop on Systems Testing and Validation |
Proceedings |
Systems Testing and Validation Workshop 2004 (SV'04) |
Paris , France |
02.12.2004 |
Fraunhofer Report Series |
Fraunhofer IRB Verlag ISBN 3-8167-6677-3 |
2004 |
Published |
| Dafina-Maria Jeaca, George Din, Axel Rennoch |
Importing XMLSchema datatypes into TTCN-3 |
Workshop paper |
Systems Testing and Validation Workshop 2004 (SV'04) |
Paris , France |
02.12.2004 |
Workshop Proceedings |
Fraunhofer IRB |
2004 |
Published |
| Jaco van de Pol |
Integration of testing techniques with automated test generation |
Presentation |
Workshop CWI/Improve |
Valkenswaard (NL) |
3.12.2004 |
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Presented |
| Thomas Deiß |
TTCN-3 for Large Systems |
Paper |
3 rd Workshop on Systems Testing and Validation |
Paris , France |
02.12.2004 |
Workshop Proceedings |
Fraunhofer IRB |
2004 |
Published |
| Simon Burton, Andre Baresel, Ina Schieferdecker |
Automated testing of automotive telematics systems using TTCN-3 |
Paper |
3 rd Workshop on Systems Testing and Validation |
Paris , France |
02.12.2004 |
Workshop Proceedings |
Fraunhofer IRB |
2004 |
Published |
| Andre Baresel |
Use of TTCN-3 for Automotive |
Presentation |
ETSI/CERTECS Workshop |
Sophia-Antipolis, France |
8.12.2004 |
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Presented |
| Theofanis Vassiliou-Gioles |
TTCN-3 Test Platform for the Automotive Industrie |
Presentation |
ETSI/CERTECS Workshop |
Sophia-Antipolis, France |
8.12.2004 |
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Presented |
| Ina Schieferdecker |
Integrated System and Test Development with the UML 2.0 Testing Profile |
Paper |
EuroStar 2004 |
Cologne , Germany |
Dec. 2004 |
Proceedings |
Qualtech |
2004 |
Published |
| Ina Schieferdecker |
MDA++: Integrated System and Test Development |
Presentation |
Informatik-Kolloqium der Universität Paderborn |
Paderborn, Germany |
Dec. 2004 |
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Presented |
| Ina Schieferdecker |
U2TP, TTCN-3 und ihre Beziehung |
Presentation |
Darmstädter Kolloquium „Softwarequalitätssicherung durch Testen“ |
Darmstadt, Germany |
Dec. 2004 |
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Presented |
| Ina Schieferdecker, George Din, Dimitrios Apostolidis |
Distributed Functional and Load tests for Web services |
Paper |
|
Heidelberg , Germany |
2005 |
International Journal on Software Tools for Technology Transfer (STTT) |
Springer |
2005 |
Accepted |
| Wan Fokkink, Matti Kärki, Jaco van de Pol, Axel Rennoch, Ina Schieferdecker and Markus Sihvonen |
Three Countries' Offensive towards Testing with Advanced Languages |
Paper |
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ERCIM News |
ERCIM |
2004 |
Published |
| S.Schulz |
Derivation of Abstract Protocol Type Definitions for the Conformance Testing of Text-Based Protocols |
Paper |
16th IFIP International Conference on Testing of Communicating Systems (TestCom 2004) |
Oxford , United Kingdom |
March 2004 |
Proceedings, LNCS Springer |
Springer |
2004 |
Published |
| Zhen Ru Dai, Jens Grabowski, Helmut Neukirchen, Holger Pals |
From Design to Test -- Applied to a Roaming Algorithm for Bluetooth Devices |
Paper |
16th IFIP International Conference on Testing of Communicating Systems (TestCom 2004) |
Oxford , United Kingdom |
March 2004 |
Proceedings, LNCS Springer |
Springer |
2004 |
Published |
| T. Vassiliou-Gioles, G. Din, I. Schieferdecker |
Execution of External Applications using TTCN-3 |
Paper |
16th IFIP International Conference on Testing of Communicating Systems (TestCom 2004) |
Oxford , United Kingdom |
March 2004 |
Proceedings, LNCS Springer |
Springer |
2004 |
Published |
H. Batteram, W. Hellenthal, W. Romijn, A. Hoffmann, A. Rennoch, A. Vouffo |
Implementation of an Open Source Toolset for CCM Components and Systems Testing |
Paper |
16th IFIP International Conference on Testing of Communicating Systems (TestCom 2004) |
Oxford , United Kingdom |
March 2004 |
Proceedings, LNCS Springer |
Springer |
2004 |
Published |
| M. Born, H.-G. Gross, P. Santos, I. Schieferdecker |
Model-Driven Development and Testing - A Case Study |
Paper |
First European Workshop on Model Driven Architecture with Emphasis on Industrial Application |
Enschede, The Netherlands |
March 2004 |
Proceedings |
University Report |
2004 |
Published |
| Zhen Ru Dai, Ina Schieferdecker |
Time Concepts for UML 2.0 Based Testing |
Paper |
Workshop on the usage of the UML profile for Scheduling, Performance and Time (SIVOES 2004), hold in conjunction with the 10TH IEEE Real-Time and Embedded Technology and Applications Symposium (RTAS 2004) |
Toronto , Canada |
June 2004 |
Proceedings |
University Report |
2004 |
Published |
| Ina Schieferdecker |
The Testing and Test Control Notation TTCN-3 |
Paper |
GI-Tagung TAV (Test, Analyse und Verifikation von Software) |
Berlin, Germany |
June 2004 |
Proceedings |
Softwaretechnik-Trends, GI |
2004 |
Published |
| Pekka Ruuska, Matti Kärki |
TTCN-3 Language Characteristics in Producing Reusable Test Software |
Paper |
Eighth International Conference on Software Reuse (ICSR-8) |
Madrid , Spain |
July 2004 |
Proceedings, LNCS Springer |
Springer |
2004 |
Published |
| Mikko Karinsalo, Pekka Abrahamsson |
Software Reuse and the Test Development Process: A Combined Approach |
Paper |
Eighth International Conference on Software Reuse (ICSR-8) |
Madrid , Spain |
July 2004 |
Proceedings, LNCS Springer |
Springer |
2004 |
Published |
| Ina Schieferdecker |
Eine TTCN-3 Testplattform für reaktive Systeme |
Paper |
Eröffnungskonferenz zur Softwareoffensive |
Berlin , Germany |
July 2004 |
Proceedings |
BMBF |
2004 |
Published |
| Erik van Veenendaal |
TTCN-3, the test specification language of the future (in dutch) |
Paper |
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The Netherlands |
June, 2004 |
TESTNET newsletter (Dutch SiGIST newsletter) |
|
2004 |
Published |
| Zhen Ru Dai, Ina Schieferdecker |
An Introduction to the UML 2.0 Testing Profile |
Presentation |
ITU-T workshop on Use of UML for ODP and ITU-T languages |
Geneva , Switzerlan |
March 2004 |
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Presented |
| Ina Schieferdecker |
TTCN-3 Tutorial |
Tutorial |
VTT Industrial Workshop |
Oulu , Finland |
March 2004 |
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Presented |
| Colin Willcock |
The TT-Medal Project |
Presentation |
VTT Industrial Workshop |
Oulu , Finland |
March 2004 |
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Presented |
| Ina Schieferdecker |
A TTCN-3 Metamodel and Its Use |
Presentation |
VTT Industrial Workshop |
Oulu , Finland |
March 2004 |
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Presented |
| Marcel Mersie |
Getting Testing under Control |
Presentation |
VTT Industrial Workshop |
Oulu , Finland |
March 2004 |
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Presented |
| Antti Huima |
Practical Model-Based Testing Today and Tomorrow |
Presentation |
VTT Industrial Workshop |
Oulu , Finland |
March 2004 |
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Presented |
| Matti Kärk |
TTCN-3 Approach to Software Testing |
Presentation |
VTT Industrial Workshop |
Oulu , Finland |
March 2004 |
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Presented |
| Hannu Rytilä |
Acquisition of Reusable Test Patterns in Testing of OBSAI (Open Base Station Architecture Initiative) Modules |
Presentation |
VTT Industrial Workshop |
Oulu , Finland |
March 2004 |
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Presented |
| Ina Schieferdecker |
UML 2.0 Testing Profile - Integrated System and Test Development |
Presentation |
LogOn Info Day OMG -Integrating the Enterprise Java™ for the Enterprise |
Berlin , Germany |
April 2004 |
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Presented |
| S.Schulz |
Practical Use of TTCN-3 for Text Based protocol Testing |
Presentation |
1st TTCN-3 User Conference |
Sophia-Antipolis , France |
May 2004 |
Conference CD |
ETSI |
2004 |
Presented |
| C. Willcock |
The TT-Medal Project |
Presentation |
1st TTCN-3 User Conference |
Sophia-Antipolis , France |
May 2004 |
Conference CD |
ETSI |
2004 |
Presented |
| Andre Baresel |
Using TTCN-3 in an automotive context |
Presentation |
1st TTCN-3 User Conference |
Sophia-Antipolis , France |
May 2004 |
Conference CD |
ETSI |
2004 |
Presented |
| Theofanis Vassiliou-Gioles |
The execution of TTCN-3 tests |
Presentation |
1st TTCN-3 User Conference |
Sophia-Antipolis , France |
May 2004 |
Conference CD |
ETSI |
2004 |
Presented |
| Ina Schieferdecker |
The UML 2.0 Testing Profile |
Presentation |
1st TTCN-3 User Conference |
Sophia-Antipolis , France |
May 2004 |
Conference CD |
ETSI |
2004 |
Presented |
| George Din |
The XML to TTCN-3 Mapping |
Presentation |
1st TTCN-3 User Conference |
Sophia-Antipolis , France |
May 2004 |
Conference CD |
ETSI |
2004 |
Presented |
| Ina Schieferdecker, Andrej Pietschker |
TTCN-3 Certified Tester |
Presentation |
1st TTCN-3 User Conference |
Sophia-Antipolis , France |
May 2004 |
Conference CD |
ETSI |
2004 |
Presented |
| Marcel Mersie, Folkert Bouma |
TTCN-3 Opportunities |
Presentation |
Testframe Seminar |
Hoofdorp , Netherlands |
June 2004 |
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Presented |
| Colin Willcock, Thomas Deiß, Stephan Tobies, Stephan Schulz, Stefan Keil, Federico Engler |
An Introduction to TTCN-3 |
Book |
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June 2004 |
|
Wiley |
2005 |
Published |
| Jos van Rooyen |
TTmedal article |
Report |
|
Netherlands |
May 2005 |
“Het Blad” Magazine |
LogicaCMG |
2005 |
Published |
| J. Zander, Z.R. Dai, I. Schieferdecker, G. Din |
From U2TP Models to Executable Tests with TTCN-3 - An Approach to Model Driven Testing |
Paper |
IFIP 17th Intern. Conf. on Testing Communicating Systems - TestCom 2005 |
Montreal/Canada |
June 2005 |
LNCS |
Springer |
2005 |
Published and Presented |
| I. Schieferdecker, A. Rennoch |
Industrial use of TTCN-3 - Scope and Limits |
Paper |
International Conference on Software Tests, ICSTEST 2005 |
Düsseldorf / Germany |
April 2005 |
Conference Proceedings |
QualTech |
2005 |
Published and Presented |
| I. Schieferdecker, A. Rennoch, E. Höfig |
TTCN-3 – A Test Technology for the Automotive Domain |
Paper |
Simulation und Test in der Funktions- und Softwareentwicklung für die Automobilelektronik |
Berlin / Germany |
March 2005 |
Conference Proceedings |
Expert Verlag |
2005 |
Published and Presented |
| Goga Nicolae, Florica Moldoveanu |
Test selections and coverages |
Paper |
17th Canadian Conference on Electrical and Computer Engineering |
Saskatchewan, Canada |
May 2005 |
Proceedings |
IEEE Computer Society |
2005 |
Published |
| Annukka Mäntyniemi, Pekka Mäki-Asiala, Matti Kärki |
A Process Model for Development and Utilization of Reusable Test Assets |
Paper |
SERP'05 - The 2005 International Conference on Software Engineering Research and Practice |
Las Vegas, Nevada, USA |
June 2005 |
SERP’05 Proceedings |
|
2005 |
Presented |
| Stefan Blom, Natalia Ioustinova, Jaco van de Pol, Axel Rennoch, and Natalia Sidorova |
Simulated time for testing railway interlockings with TTCN-3 |
Paper |
5th International Workshop on Formal Approaches to Testing of Software, FATES 2005 |
Edinburg / UK |
July 2005 |
Proceedings |
Springer |
2005 |
Published |
| I. Schieferdecker |
The UML 2.0 Test Profile as a Basis for Integrated System and Test Development |
Paper |
GI Jahrestagung, Informatik 2005 |
Bonn / Germany |
Sept. 2005 |
Proceedings |
Expert-Verlag |
2005 |
Published |
| Alain Vouffo Feudjio |
Towards Pattern-Oriented Test Development based on Abstract Test Notations |
Paper |
2nd European Symposium on Verification and Validation of Software System and Testing in Eindhoven |
Eindhoven, The Netherlands |
Sept. 2005 |
Proceedings |
University of Eindhoven |
2005 |
Published |
| Z. R. Dai, P. H. Deussen, M. Busch, L. P. Lacmene, T. Ngwangwen, J. Herrmann, M. Schmidt |
Automatic Test Data Generation for TTCN-3 using CTE |
Paper |
18th Intern. Conference "Software & Systems Engineering and their Applications" (ICSSEA 2005) |
Paris / France |
Nov-Dec 2005 |
Proceedings |
University "Conservatoire National des Arts et Métiers |
2005 |
Published |
| Dimitrios Apostolidis, Dirk Tepelmann, Axel Rennoch, Alain Vouffo |
Use of TTCN-3 for Development of SIGTRAN Tests |
Paper |
18th Intern. Conference "Software & Systems Engineering and their Applications" (ICSSEA 2005) |
Paris / France |
Nov-Dec 2005 |
Proceedings |
University "Conservatoire National des Arts et Métiers |
2005 |
Published |
| Ina Schieferdecker, George Din |
TTCN-3 Technology |
Report |
Software Competence Web Site |
Kaiserslautern, Germany |
Aug 2005 |
www.software-kompetenz.de/ttcn-3 |
VSEK |
2005 |
Published |
| Jens R. Calamé, Natalia Ioustinova, Jaco van de Pol, and Natalia Sidorova |
Abstraction and Constraint Solving for Conformance Testing |
Paper |
12th Asia Pacific Software Engineering Conference (APSEC 2005) |
Taipei, Taiwan |
Dec 2005 |
Proceedings |
IEEE Computer Society |
2005 |
Published |
| TTmedal consortium |
Future Vision on Automated Testing |
Paper |
White Paper |
online |
Sept. 2005 |
www.tt-medal.org |
|
|
Published |
| Ina Schieferdecker, Jürgen Grossmann |
Testing of Embedded Control Systems with Continous Signals |
Paper |
2nd Workshop on Modelling of Embedded Systems |
Dagstuhl, Germany |
Jan 2006 |
Proceedings |
University of Paderborn |
2005 |
Published |
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TT-Medal Publications Abstracts
D. Apostolidis, D. Tepelmann, A. Rennoch, A. Vouffo: Use of TTCN-3 for Development of SIGTRAN Tests, 18th Intern. Conference "Software & Systems Engineering and their Applications" (ICSSEA 2005)
Abstract: SIGTRAN refers to the signaling transport protocol stack standardized by IETF to build a bridge
between SS7 and IP based signaling systems. Since various SIGTRAN recommendations are new and still under
development there is an actual need for testing related products. The authors have investigated in the
development of TTCN-3 test suites for the SIGTRAN protocols M3UA and SUA.
The paper gives an insight on the development work of large industrial TTCN-3 tests. The presentation explains
the selected design approach, including test configuration or module parameters. Furthermore, we describe our
experiences w.r.t. the definition of (parameterized) data templates and behavior sequences. The challenges and
efforts due to the test suite validation and execution will be discussed, too.
P. Baker, Z. Ru Dai, J. Grabowski, Ø. Haugen, S. Lucio, E. Samuelsson, I. Schieferdecker, C. Williams: The UML 2.0 Testing Profile, Conquest 2004
Abstract: Testing often accounts for more than 50% of the required effort during system
development. However, testing is often not well integrated with other development
phases. One reason for this is that designers, developers and testers all use different
languages and tools, making it difficult to communicate with each other and to
exchange documents. The UML 2.0 Testing Profile bridges the gap between
designers and testers by providing a means to use UML for test specification and
modeling. This allows the reuse of UML design documents for testing and enables
test development in an early system development phase. The testing profile provides
support for UML based model-driven testing. This paper presents the concepts
defined in the UML 2.0 Testing Profile and explains their usage by applying those to
an example of a simplified Automated Teller Machine (ATM).
S. Blom, N. Ioustinova, J. van de Pol, A. Rennoch, N. Sidorova: Simulated time for testing railway interlockings with TTCN-3, 5th International Workshop on Formal Approaches to Testing of Software, FATES 2005
Abstract: Railway control systems are timed and safety-critical. Tes-
ting these systems is a key issue. Prior to system testing, the software of
a railway control system is tested separately from the hardware. Here we
show that real time and scaled time semantics are ine±cient for testing
this software. We provide a time semantics with simulated time and show
that this semantics is more suitable for testing of software of railway
control systems.
TTCN-3 is a standardized language for specifying and executing test
suites. It supports real time and scaled time but not simulated time.
We provide a solution that allows simulated time testing with TTCN-
3. Our solution is based on Dijkstra's distributed termination detection
algorithm. The solution is implemented and can be reused for simulated
time testing of other systems with similar characteristics.
J. R. Calamé, N. Ioustinova, J. van de Pol, N. Sidorova: Abstraction and Constraint Solving for Conformance Testing, 12th Asia Pacific Software Engineering Conference (APSEC 2005)
Abstract: Conformance testing is one of the most rigorous and
well-developed testing techniques. Model-based test generation
is an essential phase of the conformance testing approach.
The main problem in this phase is the explosion
of the number of test cases, often caused by large or infinite
data domains for input and output data. In this paper
we propose a test generation framework based on the
use of data abstraction and constraint solving to suppress
the number of test cases. The approach is evaluated on
the CEPS (Common Electronic Purse Specifications) case
study.
Z. R. Dai, J. Grabowski, H. Neukirchen, H. Pals: From Design to Test -- Applied to a Roaming Algorithm for Bluetooth Devices, 16th IFIP International Conference on Testing of Communicating Systems (TestCom 2004)
Abstract: The UML Testing Profile provides support for UML based
model-driven testing. This paper introduces a methodology of how to
use the testing profile in order to modify and extend an existing UML
design model for test issues. As a case study, a new roaming algorithm
for bluetooth devices has been developed at the University of L¨ubeck, is
modelled using UML. The usability of the UML Testing Profile will be
explained by applying it to this model.
Z. R. Dai, P. H. Deussen, M. Busch, L. P. Lacmene, T. Ngwangwen, J. Herrmann, M. Schmidt: Automatic Test Data Generation for TTCN-3 using CTE, 18th Intern. Conference "Software & Systems Engineering and their Applications" (ICSSEA 2005)
Abstract: With the growing system complexity the need for solid testing increases. The Test and Testing
Control Notation, version 3 (TTCN-3) is a standardized testing language to ease the specification of test suites.
Test data play an important role during test execution in order to explore all aspects of the system under test.
Although TTCN-3 supports good means for test data specification such as an extensive type system, automated
test data generation is not in the scope of the TTCN-3 language and requires complementary means. A promising
approach is the classification tree method (CTM), which allows for test data generation by categorizing data
domains in equivalence classes. This paper introduces an Eclipse plugin which enables the integration between
TTCN-3 and Classification Tree Editor (CTE).
T. Deiss: TTCN-3 for Large Systems, 3 rd Workshop on Systems Testing and Validation
Abstract: TTCN-3 is a relatively new language that supports several concepts to describe
quite complex test scenarios in a convenient way. To evaluate how convenient
complex test scenarios can be described in TTCN-3, we implemented several
well-known problems from concurrent programming in TTCN-3. We give a
short introduction to the problems, their implementations, and our _ndings about
TTCN-3.
A. V. Feudjio: Towards Pattern-Oriented Test Development based on Abstract Test Notations, 2nd European Symposium on Verification and Validation of Software System and Testing in Eindhoven
Abstract: The Testing and Test Control Notation TTCN-3
[1] is increasingly gaining popularity in testing
reactive systems for conformance, interoperability
and performance. TTCN-3 is a standardized test
notation which resulted from redesigning the Tree
and Tabular Combined Notation TTCN. Reaching
far beyond TTCN’s traditional domain of protocol
conformance testing, TTCN-3’s scope now includes
almost all kinds of testing of software-based systems.
In the TT-medal1 project we looked into approaches
for enabling and facilitating the reuse of TTCN-3 test
artifacts to speed up the TTCN-3 test development
process and reduce costs. The use of patterns in the
general software development process has proven to
be potentially beneficial in helping to achieve those
goals. In a previous work, we proposed to introduce
that concept to TTCN-3 test development and
pointed out which phases of the process would
benefit most from it. In this paper, we present how a
pattern-oriented test development process can
effectively reduce the production time for test
systems and more precisely for the specification of
the abstract test suite (ATS). Our approach combines
automated generation of test skeletons with manual
processing. Some examples produced with prototype
implementations are also presented to underline the
validity of the concept.
W. Fokkink, M. Kärki, J. van de Pol, A. Rennoch, I. Schieferdecker, M. Sihvonen: Three Countries' Offensive towards Testing with Advanced Languages
Abstract: The need for appropriate means to test systems and software is still alive! Even
though a huge number of test tools are on the market, series of conferences on
testing continue to be held, and an international standard on testing methodology
has existed for more than ten years. Most industries are still looking for ways to
make their testing process more effective, efficient and understandable, to
strengthen confidence in their products and services. Three European countries,
Finland, Germany and the Netherlands, have started a common offensive to
establish a basis for the industrial application of tests and testing methodologies
with advanced languages. Independent national funding sources have been
brought together for the TT-Medal project under the supervision of the Information
Technology for European Advancement (ITEA) association.
M. Karinsalo, P. Abrahamsson: Software Reuse and the Test Development Process: A Combined Approach, Eighth International Conference on Software Reuse (ICSR-8)
Abstract: Testing is the most time consuming activity in the software development
process. The effectiveness of software testing is primarily determined
by the quality of the testing process. Software reuse, when effectively applied,
has shown to increase the productivity of a software process and enhance the
quality of software by the use of components already tested on a large scale.
While reusability of testing material and tests has a strong potential, few if any
approaches have been proposed that combine these two aspects. Reusability of
testing materials is desired, when test development is complex and timeconsuming.
This is the case, for example, in testing with test-specific languages,
such as the TTCN-3. To meet these needs, this paper suggests a test
development process model that takes software reuse techniques and activities
into account. This paper shows further that in order to produce reusable test
material, the software entities must be expressed in terms of features, in which
the test materials are attached to. Also, the software components must be designed
with reuse in mind when reusable test material is desired. The scope of
the proposed test development approach is on the unit and integration testing,
because the outcome of higher levels of testing is typically dependent on the
tester’s subjective judgment.
A. Mäntyniemi, P. Mäki-Asiala, M. Kärki: A Process Model for Development and Utilization of Reusable Test Assets, SERP'05 - The 2005 International Conference on Software Engineering Research and Practice
Abstract: Demands for software testing and quality assurance are ever-increasing as the size and complexity of the software systems expand and the markets demand high-quality software products in shorter cycles. Furthermore, software reuse sets demands for testing practices, which are forced to keep up with the pace. One of the major benefits expected from software reuse is shorter development time. Whereas software reuse process models and development methods have evolved to support more rapid development, testing may be a bottleneck in otherwise efficient software production. This raises a question if software reuse methods could also be used in the testing context in order to improve efficiency of testing. This paper proposes a tentative test development process model for development and utilization of reusable test assets. The model incorporates activities known from software reuse and corresponding activities identified from the earlier test reuse studies into the software testing process context.
G. Nicolae, F. Moldoveanu: Test selections and coverages, 17th Canadian Conference on Electrical and Computer Engineering
Abstract: One of the main open issues in testing and in particular
in conformance testing is finding a good way of measuring
the quality of the testing activity, i.e. the coverage
measure. There is not a general agreement on this issue, although
different tentative where made to propose different
coverage measures. Therefore, there is a demand for more
research for creating a more general agreement on the coverage
measure. The present paper tries to built up a solution
for this necessity.
P. Ruuska, M. Kärki: TTCN-3 Language Characteristics in Producing Reusable Test Software, Eighth International Conference on Software Reuse (ICSR-8)
Abstract: TTCN-3 is a new programming language, which was especially
developed for testing. We analyzed how well the structure and the features of
TTCN-3 conform to producing reusable test software. The analysis is mostly
based on the conceptual model introduced in [1,2], the principles presented in
[7,8,10] and our own understanding and experience of reusable software. Our
conclusion is that TTCN-3 provides the basic language features for developing
reusable test software. The modular structure of the language, its controlled and
explicit interfaces promote reusability. Furthermore, the test specific characteristics
of TTCN-3, which include its specific data types, expressions and test
configurations, support reusability as well. When TTCN-3 is used in conformance
testing of telecommunication protocols the reusability potential of
TTCN-3 code is high. The more advanced reusability features that are required
for object-oriented programming are not currently supported in TTCN-3.
I. Schieferdecker, G. Din: A Metamodel for TTCN-3, ITM 2004
Abstract: The Testing and Test Control Notation TTCN-3 is a test
specification and implementation language that has been defined classically
in form of a formal syntax and a semiformal semantics. UML,
MOF and MDA has shown that on contrary meta-model based language
definitions impose new ways of defining language semantics as a separation
of syntax and semantic concept space, of integrating languages
via a common meta-model base and of generating and deriving models
from other models via model transformers. This paper defines a metamodel
for TTCN-3, such that TTCN-3 can take advantage of meta-model
based approaches - in particular for integrating test but also system development
techniques. It also discusses the realization of the TTCN-3
meta-model and its use for meta-model based tools.
I. Schieferdecker, A. Rennoch: Industrial use of TTCN-3 - Scope and Limits, International Conference on Software Tests, ICSTEST 2005
Abstract: Traditionally the Testing and Test Control Notation TTCN has been used and accepted widely in the telecom
industry. The new version TTCN-3 is intended to be applicable to a broader scope of communication and
software systems. This paper describes first results of a research project with the aim of evaluating the use of
TTCN-3 within the automotive telematics and the mobile communication domain. The paper addresses the use
of TTCN-3 to specify the reusable test cases and the development of a TTCN-3 based test tool environment
fulfilling testing requirements of these domains.
I. Schieferdecker, A. Rennoch, E. Höfig: TTCN-3 – A Test Technology for the Automotive Domain, Simulation und Test in der Funktions- und Softwareentwicklung für die Automobilelektronik
See the Abstract of Industrial use of TTCN-3 - Scope and Limits.
I. Schieferdecker: The UML 2.0 Test Profile as a Basis for Integrated System and Test Development, GI Jahrestagung, Informatik 2005
Abstract: Model centric development and engineering according to Model-Driven
Architectures (MDA) has recently gained much attention. This paper presents an
approach how a model centric approach cannot only be used for system
development but also at the same time to support the provision of system tests
which are to be an integral part of the overall system development. The paper
discusses the various artefacts for model-based testing along MDA and their
relation to the artefacts in system development. The testing artefacts can be
designed and modelled with the UML 2.0 Testing Profile (U2TP) which extends
UML 2.0 with test specific concepts.
I. Schieferdecker, G. Din: TTCN-3 Technology, Software Competence Web Site
Abstract: TTCN (die Testing and Test Control Notation TTCN-3) ist eine weit verbreitete und eingesetzte Testtechnologie - traditionell aus der Telekommunikation. In seiner neuen Version adressiert TTCN-3 einen breiteren Bereich und ermöglicht eine weite Anwendbarkeit. Es kann nicht nur für das Testen der Konformität und Interoperabilität von Kommunikationsprotokollen, sondern auch beispielsweise für das Testen der Interaktion von Sensoren, Aktuatoren und Steuereinheiten, die über Bussysteme angeschlossen werden, genutzt werden. TTCN-3 wird daher auch in der Automobil- und Eisenbahntechnik, sowie in Luftfahrt- und Sicherheitssystemen verwendet
I. Schieferdecker, J. Grossmann: Testing of Embedded Control Systems with Continous Signals, 2nd Workshop on Modelling of Embedded Systems
Abstract:The systematic testing approaches developed within the telecommunication domain for
conformance and interoperability testing of communication protocols have been extended
and broadened to allow the testing of local and distributed, reactive and proactive systems
in further domains such as Internet, IT, control systems in automotive, railways, avionics
and alike. With the application of these testing principles it became apparent that the
testing of systems with continuous systems is different to that of discrete systems.
Although every continuous signal can be discretized by sampling methods (and hence
mapped to the discrete signal paradigm), abstraction and performance issues in this
setting become critical. This paper investigates the different options to support tests of
embedded control systems in the framework of TTCN-3.
J. Zander, Z.R. Dai, I. Schieferdecker, G. Din: From U2TP Models to Executable Tests with TTCN-3 - An Approach to Model Driven Testing, IFIP 17th Intern. Conf. on Testing Communicating Systems - TestCom 2005
Abstract: The approach towards system engineering according to Model-Driven Architectures (MDA)
with code generation derived from model implies also an increased need for research on
automation of the test generation process. This paper presents an approach to derive executable
tests from UML 2.0 Testing Profile diagrams automatically. In particular, an approach to derive
executable tests within the Testing and Test Control Notation (TTCN-3) is discussed. The
transformation rules between the source U2TP meta-model to the target TTCN-3 meta-model
are given.
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