TT-Medal Publications

To see the abstracs of the publications, please click on the marked titles!

Author Title Type Name of the
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Place /
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Date Published in Publisher Publish Year Status
Name   Paper
Report
Presentation
            Planned
Submitted
Accepted
Published
Presented
Hannu Rytilä Making OBSAI Standard Better with formal test languages – Usage of TTCN-3 in testing of OBSAI Modules Presentation OBSAI Shanghai , China 6.7.2004       Presented
Ina Schieferdecker Eine TTCN-3 Testplattform für reaktive Systeme Presentation Forschungsoffensive "Software Engineering 2006, "Eröffnungskonferenz Berlin, Germany July 2004       Presented
Annukka Mäntyniemi & Pekka Mäki-Asiala Improving Efficiency of Testing with Test Reuse Workshop paper 3rd Software Product Line Conference (SPLC 2004) - Workshop on Quality Assurance in Reuse Contexts Boston , Massachusetts , USA August 30 – September 2, 2004 http://docserver.fhg.de/iese/2004/reports/096.pdf Fraunhofer IESE   Published
Paul Baker, Zhen Ru Dai, Jens Grabowski, Øystein Haugen, Serge Lucio, Eric Samuelsson, Ina Schieferdecker, and Clay Williams The UML 2.0 Testing Profile Paper Conquest 2004 Nuremberg , Germany September 2004 Proceedings ASQF e.V. 2004 Published
Alain Vouffo-Feudjio and Ina Schieferdecker Test Patterns with TTCN-3 Paper FATES 2004 Linz , Austria Linz , Austria

Proceedings, LNCS

Springer 2005 Accepted
Colin Willcock Improved Testing with TTCN-3 Presentation 5 th ITEA Symposium, workhsop on Innovation in Software Engineering Seville , Spain

7.10.2004

       
Hannu Rytilä

SIP Service Testing for Mobile Clients - A Solution Using Simulated Network

Presentation NETS Results Promotion, Tekes Helsinki , Finland 19.10.2004 http://oppimisteollisuus.evtek.fi/NETS/ Tekes 2004 Presented
Ina Schieferdecker, George Din A Metamodel for TTCN-3 Paper ITM 2004 Toledo , Spain Oct. 2004

Proceedings, LNCS

Springer 2004 Published
Ina Schieferdecker The Testing and Test Control Notation TTCN-3 Presentation TIMNA 2004 Beijing , China Oct. 2004       Presented
Ina Schieferdecker The UML 2.0 Testing Profile Presentation TIMNA 2004 Beijing , China Oct. 2004       Presented
George Din, Justyna Zander, Stephan Pietsch Test exectution logging and visualization techniques Conference Paper Software & Systems Engineering and their Applications (ICSSEA04) Paris , France 30.11.2004 CNAM ICSSEA Proceeding, ISSN 1637-5033 s 2004 Published
M. Born, I. Schieferdecker, O. Kath and C. Hirai Combining System Development and System Test in a Model-centric Approach Paper RISE 2004 Luxembourg , Luxembourg Nov. 2004

Proceedings, LNCS

Springer 2005 Accepted
Juan Garbarjosa, Jorgen Boegh, Patricia Rodriguez-Dapena, Axel Rennoch Proceedings 3rd Workshop on Systems Testing and Validation Proceedings Systems Testing and Validation Workshop 2004 (SV'04) Paris , France 02.12.2004 Fraunhofer Report Series Fraunhofer IRB Verlag ISBN 3-8167-6677-3 2004 Published
Dafina-Maria Jeaca, George Din, Axel Rennoch Importing XMLSchema datatypes into TTCN-3 Workshop paper Systems Testing and Validation Workshop 2004 (SV'04) Paris , France 02.12.2004 Workshop Proceedings Fraunhofer IRB 2004 Published
Jaco van de Pol Integration of testing techniques with automated test generation Presentation Workshop CWI/Improve Valkenswaard (NL) 3.12.2004       Presented
Thomas Deiß TTCN-3 for Large Systems Paper 3 rd Workshop on Systems Testing and Validation Paris , France 02.12.2004 Workshop Proceedings Fraunhofer IRB 2004 Published
Simon Burton, Andre Baresel, Ina Schieferdecker Automated testing of automotive telematics systems using TTCN-3 Paper 3 rd Workshop on Systems Testing and Validation Paris , France 02.12.2004 Workshop Proceedings Fraunhofer IRB 2004 Published
Andre Baresel Use of TTCN-3 for Automotive Presentation ETSI/CERTECS Workshop Sophia-Antipolis, France 8.12.2004       Presented
Theofanis Vassiliou-Gioles TTCN-3 Test Platform for the Automotive Industrie Presentation ETSI/CERTECS Workshop Sophia-Antipolis, France 8.12.2004       Presented
Ina Schieferdecker Integrated System and Test Development with the UML 2.0 Testing Profile Paper EuroStar 2004 Cologne , Germany Dec. 2004 Proceedings Qualtech 2004 Published
Ina Schieferdecker MDA++: Integrated System and Test Development Presentation Informatik-Kolloqium der Universität Paderborn Paderborn, Germany Dec. 2004       Presented
Ina Schieferdecker U2TP, TTCN-3 und ihre Beziehung Presentation Darmstädter Kolloquium „Softwarequalitätssicherung durch Testen“ Darmstadt, Germany Dec. 2004       Presented
Ina Schieferdecker, George Din, Dimitrios Apostolidis Distributed Functional and Load tests for Web services Paper   Heidelberg , Germany 2005 International Journal on Software Tools for Technology Transfer (STTT) Springer 2005 Accepted
Wan Fokkink, Matti Kärki, Jaco van de Pol, Axel Rennoch, Ina Schieferdecker and Markus Sihvonen Three Countries' Offensive towards Testing with Advanced Languages Paper       ERCIM News ERCIM 2004 Published
S.Schulz Derivation of Abstract Protocol Type Definitions for the Conformance Testing of Text-Based Protocols Paper 16th IFIP International Conference on Testing of Communicating Systems (TestCom 2004) Oxford , United Kingdom March 2004 Proceedings, LNCS Springer Springer 2004 Published
Zhen Ru Dai, Jens Grabowski, Helmut Neukirchen, Holger Pals From Design to Test -- Applied to a Roaming Algorithm for Bluetooth Devices Paper 16th IFIP International Conference on Testing of Communicating Systems (TestCom 2004) Oxford , United Kingdom March 2004 Proceedings, LNCS Springer Springer 2004 Published
T. Vassiliou-Gioles, G. Din, I. Schieferdecker Execution of External Applications using TTCN-3 Paper 16th IFIP International Conference on Testing of Communicating Systems (TestCom 2004) Oxford , United Kingdom March 2004 Proceedings, LNCS Springer Springer 2004 Published

H. Batteram, W. Hellenthal, W. Romijn, A. Hoffmann, A. Rennoch, A. Vouffo

Implementation of an Open Source Toolset for CCM Components and Systems Testing Paper 16th IFIP International Conference on Testing of Communicating Systems (TestCom 2004) Oxford , United Kingdom March 2004 Proceedings, LNCS Springer Springer 2004 Published
M. Born, H.-G. Gross, P. Santos, I. Schieferdecker Model-Driven Development and Testing - A Case Study Paper First European Workshop on Model Driven Architecture with Emphasis on Industrial Application Enschede, The Netherlands March 2004 Proceedings University Report 2004 Published
Zhen Ru Dai, Ina Schieferdecker Time Concepts for UML 2.0 Based Testing Paper Workshop on the usage of the UML profile for Scheduling, Performance and Time (SIVOES 2004), hold in conjunction with the 10TH IEEE Real-Time and Embedded Technology and Applications Symposium (RTAS 2004) Toronto , Canada June 2004 Proceedings University Report 2004 Published
Ina Schieferdecker The Testing and Test Control Notation TTCN-3 Paper GI-Tagung TAV (Test, Analyse und Verifikation von Software) Berlin, Germany June 2004 Proceedings Softwaretechnik-Trends, GI 2004 Published
Pekka Ruuska, Matti Kärki TTCN-3 Language Characteristics in Producing Reusable Test Software Paper Eighth International Conference on Software Reuse (ICSR-8) Madrid , Spain July 2004 Proceedings, LNCS Springer Springer 2004 Published
Mikko Karinsalo, Pekka Abrahamsson Software Reuse and the Test Development Process: A Combined Approach Paper Eighth International Conference on Software Reuse (ICSR-8) Madrid , Spain July 2004 Proceedings, LNCS Springer Springer 2004 Published
Ina Schieferdecker Eine TTCN-3 Testplattform für reaktive Systeme Paper Eröffnungskonferenz zur Softwareoffensive Berlin , Germany July 2004 Proceedings BMBF 2004 Published
Erik van Veenendaal TTCN-3, the test specification language of the future (in dutch) Paper   The Netherlands June, 2004 TESTNET newsletter (Dutch SiGIST newsletter)   2004 Published
Zhen Ru Dai, Ina Schieferdecker An Introduction to the UML 2.0 Testing Profile Presentation ITU-T workshop on Use of UML for ODP and ITU-T languages Geneva , Switzerlan March 2004       Presented
Ina Schieferdecker TTCN-3 Tutorial Tutorial VTT Industrial Workshop Oulu , Finland March 2004       Presented
Colin Willcock The TT-Medal Project Presentation VTT Industrial Workshop Oulu , Finland March 2004       Presented
Ina Schieferdecker A TTCN-3 Metamodel and Its Use Presentation VTT Industrial Workshop Oulu , Finland March 2004       Presented
Marcel Mersie Getting Testing under Control Presentation VTT Industrial Workshop Oulu , Finland March 2004       Presented
Antti Huima Practical Model-Based Testing Today and Tomorrow Presentation VTT Industrial Workshop Oulu , Finland March 2004       Presented
Matti Kärk TTCN-3 Approach to Software Testing Presentation VTT Industrial Workshop Oulu , Finland March 2004       Presented
Hannu Rytilä Acquisition of Reusable Test Patterns in Testing of OBSAI (Open Base Station Architecture Initiative) Modules Presentation VTT Industrial Workshop Oulu , Finland March 2004       Presented
Ina Schieferdecker UML 2.0 Testing Profile - Integrated System and Test Development Presentation LogOn Info Day OMG -Integrating the Enterprise Java™ for the Enterprise Berlin , Germany April 2004       Presented
S.Schulz Practical Use of TTCN-3 for Text Based protocol Testing Presentation 1st TTCN-3 User Conference Sophia-Antipolis , France May 2004 Conference CD ETSI 2004 Presented
C. Willcock The TT-Medal Project Presentation 1st TTCN-3 User Conference Sophia-Antipolis , France May 2004 Conference CD ETSI 2004 Presented
Andre Baresel Using TTCN-3 in an automotive context Presentation 1st TTCN-3 User Conference Sophia-Antipolis , France May 2004 Conference CD ETSI 2004 Presented
Theofanis Vassiliou-Gioles The execution of TTCN-3 tests Presentation 1st TTCN-3 User Conference Sophia-Antipolis , France May 2004 Conference CD ETSI 2004 Presented
Ina Schieferdecker The UML 2.0 Testing Profile Presentation 1st TTCN-3 User Conference Sophia-Antipolis , France May 2004 Conference CD ETSI 2004 Presented
George Din The XML to TTCN-3 Mapping Presentation 1st TTCN-3 User Conference Sophia-Antipolis , France May 2004 Conference CD ETSI 2004 Presented
Ina Schieferdecker, Andrej Pietschker TTCN-3 Certified Tester Presentation 1st TTCN-3 User Conference Sophia-Antipolis , France May 2004 Conference CD ETSI 2004 Presented
Marcel Mersie, Folkert Bouma TTCN-3 Opportunities Presentation Testframe Seminar Hoofdorp , Netherlands June 2004       Presented
Colin Willcock, Thomas Deiß, Stephan Tobies, Stephan Schulz, Stefan Keil, Federico Engler An Introduction to TTCN-3 Book     June 2004   Wiley 2005 Published
Jos van Rooyen TTmedal article Report   Netherlands May 2005 “Het Blad” Magazine LogicaCMG 2005 Published
J. Zander, Z.R. Dai, I. Schieferdecker, G. Din From U2TP Models to Executable Tests with TTCN-3 - An Approach to Model Driven Testing Paper IFIP 17th Intern. Conf. on Testing Communicating Systems - TestCom 2005 Montreal/Canada June 2005 LNCS Springer 2005 Published and Presented
I. Schieferdecker, A. Rennoch Industrial use of TTCN-3 - Scope and Limits Paper International Conference on Software Tests, ICSTEST 2005 Düsseldorf / Germany April 2005 Conference Proceedings QualTech 2005 Published and Presented
I. Schieferdecker, A. Rennoch, E. Höfig TTCN-3 – A Test Technology for the Automotive Domain Paper Simulation und Test in der Funktions- und Softwareentwicklung für die Automobilelektronik Berlin / Germany March 2005 Conference Proceedings Expert Verlag 2005 Published and Presented
Goga Nicolae, Florica Moldoveanu Test selections and coverages Paper 17th Canadian Conference on Electrical and Computer Engineering Saskatchewan, Canada May 2005 Proceedings IEEE Computer Society 2005 Published
Annukka Mäntyniemi, Pekka Mäki-Asiala, Matti Kärki A Process Model for Development and Utilization of Reusable Test Assets Paper SERP'05 - The 2005 International Conference on Software Engineering Research and Practice Las Vegas, Nevada, USA June 2005 SERP’05 Proceedings 2005 Presented
Stefan Blom, Natalia Ioustinova, Jaco van de Pol, Axel Rennoch, and Natalia Sidorova Simulated time for testing railway interlockings with TTCN-3 Paper 5th International Workshop on Formal Approaches to Testing of Software, FATES 2005 Edinburg / UK July 2005 Proceedings Springer 2005 Published
I. Schieferdecker The UML 2.0 Test Profile as a Basis for Integrated System and Test Development Paper GI Jahrestagung, Informatik 2005 Bonn / Germany Sept. 2005 Proceedings Expert-Verlag 2005 Published
Alain Vouffo Feudjio Towards Pattern-Oriented Test Development based on Abstract Test Notations Paper 2nd European Symposium on Verification and Validation of Software System and Testing in Eindhoven Eindhoven, The Netherlands Sept. 2005 Proceedings University of Eindhoven 2005 Published
Z. R. Dai, P. H. Deussen, M. Busch, L. P. Lacmene, T. Ngwangwen, J. Herrmann, M. Schmidt Automatic Test Data Generation for TTCN-3 using CTE Paper 18th Intern. Conference "Software & Systems Engineering and their Applications" (ICSSEA 2005) Paris / France Nov-Dec 2005 Proceedings University "Conservatoire National des Arts et Métiers 2005 Published
Dimitrios Apostolidis, Dirk Tepelmann, Axel Rennoch, Alain Vouffo Use of TTCN-3 for Development of SIGTRAN Tests Paper 18th Intern. Conference "Software & Systems Engineering and their Applications" (ICSSEA 2005) Paris / France Nov-Dec 2005 Proceedings University "Conservatoire National des Arts et Métiers 2005 Published
Ina Schieferdecker, George Din TTCN-3 Technology Report Software Competence Web Site Kaiserslautern, Germany Aug 2005 www.software-kompetenz.de/ttcn-3 VSEK 2005 Published
Jens R. Calamé, Natalia Ioustinova, Jaco van de Pol, and Natalia Sidorova Abstraction and Constraint Solving for Conformance Testing Paper 12th Asia Pacific Software Engineering Conference (APSEC 2005) Taipei, Taiwan Dec 2005 Proceedings IEEE Computer Society 2005 Published
TTmedal consortium Future Vision on Automated Testing Paper White Paper online Sept. 2005 www.tt-medal.org Published
Ina Schieferdecker, Jürgen Grossmann Testing of Embedded Control Systems with Continous Signals Paper 2nd Workshop on Modelling of Embedded Systems Dagstuhl, Germany Jan 2006 Proceedings University of Paderborn 2005 Published

TT-Medal Publications Abstracts

D. Apostolidis, D. Tepelmann, A. Rennoch, A. Vouffo: Use of TTCN-3 for Development of SIGTRAN Tests, 18th Intern. Conference "Software & Systems Engineering and their Applications" (ICSSEA 2005)

Abstract: SIGTRAN refers to the signaling transport protocol stack standardized by IETF to build a bridge between SS7 and IP based signaling systems. Since various SIGTRAN recommendations are new and still under development there is an actual need for testing related products. The authors have investigated in the development of TTCN-3 test suites for the SIGTRAN protocols M3UA and SUA.
The paper gives an insight on the development work of large industrial TTCN-3 tests. The presentation explains the selected design approach, including test configuration or module parameters. Furthermore, we describe our experiences w.r.t. the definition of (parameterized) data templates and behavior sequences. The challenges and efforts due to the test suite validation and execution will be discussed, too.

P. Baker, Z. Ru Dai, J. Grabowski, Ø. Haugen, S. Lucio, E. Samuelsson, I. Schieferdecker, C. Williams: The UML 2.0 Testing Profile, Conquest 2004

Abstract: Testing often accounts for more than 50% of the required effort during system development. However, testing is often not well integrated with other development phases. One reason for this is that designers, developers and testers all use different languages and tools, making it difficult to communicate with each other and to exchange documents. The UML 2.0 Testing Profile bridges the gap between designers and testers by providing a means to use UML for test specification and modeling. This allows the reuse of UML design documents for testing and enables test development in an early system development phase. The testing profile provides support for UML based model-driven testing. This paper presents the concepts defined in the UML 2.0 Testing Profile and explains their usage by applying those to an example of a simplified Automated Teller Machine (ATM).

S. Blom, N. Ioustinova, J. van de Pol, A. Rennoch, N. Sidorova: Simulated time for testing railway interlockings with TTCN-3, 5th International Workshop on Formal Approaches to Testing of Software, FATES 2005

Abstract: Railway control systems are timed and safety-critical. Tes- ting these systems is a key issue. Prior to system testing, the software of a railway control system is tested separately from the hardware. Here we show that real time and scaled time semantics are ine±cient for testing this software. We provide a time semantics with simulated time and show that this semantics is more suitable for testing of software of railway control systems.
TTCN-3 is a standardized language for specifying and executing test suites. It supports real time and scaled time but not simulated time. We provide a solution that allows simulated time testing with TTCN- 3. Our solution is based on Dijkstra's distributed termination detection algorithm. The solution is implemented and can be reused for simulated time testing of other systems with similar characteristics.

J. R. Calamé, N. Ioustinova, J. van de Pol, N. Sidorova: Abstraction and Constraint Solving for Conformance Testing, 12th Asia Pacific Software Engineering Conference (APSEC 2005)

Abstract: Conformance testing is one of the most rigorous and well-developed testing techniques. Model-based test generation is an essential phase of the conformance testing approach. The main problem in this phase is the explosion of the number of test cases, often caused by large or infinite data domains for input and output data. In this paper we propose a test generation framework based on the use of data abstraction and constraint solving to suppress the number of test cases. The approach is evaluated on the CEPS (Common Electronic Purse Specifications) case study.

Z. R. Dai, J. Grabowski, H. Neukirchen, H. Pals: From Design to Test -- Applied to a Roaming Algorithm for Bluetooth Devices, 16th IFIP International Conference on Testing of Communicating Systems (TestCom 2004)

Abstract: The UML Testing Profile provides support for UML based model-driven testing. This paper introduces a methodology of how to use the testing profile in order to modify and extend an existing UML design model for test issues. As a case study, a new roaming algorithm for bluetooth devices has been developed at the University of L¨ubeck, is modelled using UML. The usability of the UML Testing Profile will be explained by applying it to this model.

Z. R. Dai, P. H. Deussen, M. Busch, L. P. Lacmene, T. Ngwangwen, J. Herrmann, M. Schmidt: Automatic Test Data Generation for TTCN-3 using CTE, 18th Intern. Conference "Software & Systems Engineering and their Applications" (ICSSEA 2005)

Abstract: With the growing system complexity the need for solid testing increases. The Test and Testing Control Notation, version 3 (TTCN-3) is a standardized testing language to ease the specification of test suites. Test data play an important role during test execution in order to explore all aspects of the system under test. Although TTCN-3 supports good means for test data specification such as an extensive type system, automated test data generation is not in the scope of the TTCN-3 language and requires complementary means. A promising approach is the classification tree method (CTM), which allows for test data generation by categorizing data domains in equivalence classes. This paper introduces an Eclipse plugin which enables the integration between TTCN-3 and Classification Tree Editor (CTE).

T. Deiss: TTCN-3 for Large Systems, 3 rd Workshop on Systems Testing and Validation

Abstract: TTCN-3 is a relatively new language that supports several concepts to describe quite complex test scenarios in a convenient way. To evaluate how convenient complex test scenarios can be described in TTCN-3, we implemented several well-known problems from concurrent programming in TTCN-3. We give a short introduction to the problems, their implementations, and our _ndings about TTCN-3.

A. V. Feudjio: Towards Pattern-Oriented Test Development based on Abstract Test Notations, 2nd European Symposium on Verification and Validation of Software System and Testing in Eindhoven

Abstract: The Testing and Test Control Notation TTCN-3 [1] is increasingly gaining popularity in testing reactive systems for conformance, interoperability and performance. TTCN-3 is a standardized test notation which resulted from redesigning the Tree and Tabular Combined Notation TTCN. Reaching far beyond TTCN’s traditional domain of protocol conformance testing, TTCN-3’s scope now includes almost all kinds of testing of software-based systems. In the TT-medal1 project we looked into approaches for enabling and facilitating the reuse of TTCN-3 test artifacts to speed up the TTCN-3 test development process and reduce costs. The use of patterns in the general software development process has proven to be potentially beneficial in helping to achieve those goals. In a previous work, we proposed to introduce that concept to TTCN-3 test development and pointed out which phases of the process would benefit most from it. In this paper, we present how a pattern-oriented test development process can effectively reduce the production time for test systems and more precisely for the specification of the abstract test suite (ATS). Our approach combines automated generation of test skeletons with manual processing. Some examples produced with prototype implementations are also presented to underline the validity of the concept.

W. Fokkink, M. Kärki, J. van de Pol, A. Rennoch, I. Schieferdecker, M. Sihvonen: Three Countries' Offensive towards Testing with Advanced Languages

Abstract: The need for appropriate means to test systems and software is still alive! Even though a huge number of test tools are on the market, series of conferences on testing continue to be held, and an international standard on testing methodology has existed for more than ten years. Most industries are still looking for ways to make their testing process more effective, efficient and understandable, to strengthen confidence in their products and services. Three European countries, Finland, Germany and the Netherlands, have started a common offensive to establish a basis for the industrial application of tests and testing methodologies with advanced languages. Independent national funding sources have been brought together for the TT-Medal project under the supervision of the Information Technology for European Advancement (ITEA) association.

M. Karinsalo, P. Abrahamsson: Software Reuse and the Test Development Process: A Combined Approach, Eighth International Conference on Software Reuse (ICSR-8)

Abstract: Testing is the most time consuming activity in the software development process. The effectiveness of software testing is primarily determined by the quality of the testing process. Software reuse, when effectively applied, has shown to increase the productivity of a software process and enhance the quality of software by the use of components already tested on a large scale. While reusability of testing material and tests has a strong potential, few if any approaches have been proposed that combine these two aspects. Reusability of testing materials is desired, when test development is complex and timeconsuming. This is the case, for example, in testing with test-specific languages, such as the TTCN-3. To meet these needs, this paper suggests a test development process model that takes software reuse techniques and activities into account. This paper shows further that in order to produce reusable test material, the software entities must be expressed in terms of features, in which the test materials are attached to. Also, the software components must be designed with reuse in mind when reusable test material is desired. The scope of the proposed test development approach is on the unit and integration testing, because the outcome of higher levels of testing is typically dependent on the tester’s subjective judgment.

A. Mäntyniemi, P. Mäki-Asiala, M. Kärki: A Process Model for Development and Utilization of Reusable Test Assets, SERP'05 - The 2005 International Conference on Software Engineering Research and Practice

Abstract: Demands for software testing and quality assurance are ever-increasing as the size and complexity of the software systems expand and the markets demand high-quality software products in shorter cycles. Furthermore, software reuse sets demands for testing practices, which are forced to keep up with the pace. One of the major benefits expected from software reuse is shorter development time. Whereas software reuse process models and development methods have evolved to support more rapid development, testing may be a bottleneck in otherwise efficient software production. This raises a question if software reuse methods could also be used in the testing context in order to improve efficiency of testing. This paper proposes a tentative test development process model for development and utilization of reusable test assets. The model incorporates activities known from software reuse and corresponding activities identified from the earlier test reuse studies into the software testing process context.

G. Nicolae, F. Moldoveanu: Test selections and coverages, 17th Canadian Conference on Electrical and Computer Engineering

Abstract: One of the main open issues in testing and in particular in conformance testing is finding a good way of measuring the quality of the testing activity, i.e. the coverage measure. There is not a general agreement on this issue, although different tentative where made to propose different coverage measures. Therefore, there is a demand for more research for creating a more general agreement on the coverage measure. The present paper tries to built up a solution for this necessity.

P. Ruuska, M. Kärki: TTCN-3 Language Characteristics in Producing Reusable Test Software, Eighth International Conference on Software Reuse (ICSR-8)

Abstract: TTCN-3 is a new programming language, which was especially developed for testing. We analyzed how well the structure and the features of TTCN-3 conform to producing reusable test software. The analysis is mostly based on the conceptual model introduced in [1,2], the principles presented in [7,8,10] and our own understanding and experience of reusable software. Our conclusion is that TTCN-3 provides the basic language features for developing reusable test software. The modular structure of the language, its controlled and explicit interfaces promote reusability. Furthermore, the test specific characteristics of TTCN-3, which include its specific data types, expressions and test configurations, support reusability as well. When TTCN-3 is used in conformance testing of telecommunication protocols the reusability potential of TTCN-3 code is high. The more advanced reusability features that are required for object-oriented programming are not currently supported in TTCN-3.

I. Schieferdecker, G. Din: A Metamodel for TTCN-3, ITM 2004

Abstract: The Testing and Test Control Notation TTCN-3 is a test specification and implementation language that has been defined classically in form of a formal syntax and a semiformal semantics. UML, MOF and MDA has shown that on contrary meta-model based language definitions impose new ways of defining language semantics as a separation of syntax and semantic concept space, of integrating languages via a common meta-model base and of generating and deriving models from other models via model transformers. This paper defines a metamodel for TTCN-3, such that TTCN-3 can take advantage of meta-model based approaches - in particular for integrating test but also system development techniques. It also discusses the realization of the TTCN-3 meta-model and its use for meta-model based tools.

I. Schieferdecker, A. Rennoch: Industrial use of TTCN-3 - Scope and Limits, International Conference on Software Tests, ICSTEST 2005

Abstract: Traditionally the Testing and Test Control Notation TTCN has been used and accepted widely in the telecom industry. The new version TTCN-3 is intended to be applicable to a broader scope of communication and software systems. This paper describes first results of a research project with the aim of evaluating the use of TTCN-3 within the automotive telematics and the mobile communication domain. The paper addresses the use of TTCN-3 to specify the reusable test cases and the development of a TTCN-3 based test tool environment fulfilling testing requirements of these domains.

I. Schieferdecker, A. Rennoch, E. Höfig: TTCN-3 – A Test Technology for the Automotive Domain, Simulation und Test in der Funktions- und Softwareentwicklung für die Automobilelektronik

See the Abstract of Industrial use of TTCN-3 - Scope and Limits.

I. Schieferdecker: The UML 2.0 Test Profile as a Basis for Integrated System and Test Development, GI Jahrestagung, Informatik 2005

Abstract: Model centric development and engineering according to Model-Driven Architectures (MDA) has recently gained much attention. This paper presents an approach how a model centric approach cannot only be used for system development but also at the same time to support the provision of system tests which are to be an integral part of the overall system development. The paper discusses the various artefacts for model-based testing along MDA and their relation to the artefacts in system development. The testing artefacts can be designed and modelled with the UML 2.0 Testing Profile (U2TP) which extends UML 2.0 with test specific concepts.

I. Schieferdecker, G. Din: TTCN-3 Technology, Software Competence Web Site

Abstract: TTCN (die Testing and Test Control Notation TTCN-3) ist eine weit verbreitete und eingesetzte Testtechnologie - traditionell aus der Telekommunikation. In seiner neuen Version adressiert TTCN-3 einen breiteren Bereich und ermöglicht eine weite Anwendbarkeit. Es kann nicht nur für das Testen der Konformität und Interoperabilität von Kommunikationsprotokollen, sondern auch beispielsweise für das Testen der Interaktion von Sensoren, Aktuatoren und Steuereinheiten, die über Bussysteme angeschlossen werden, genutzt werden. TTCN-3 wird daher auch in der Automobil- und Eisenbahntechnik, sowie in Luftfahrt- und Sicherheitssystemen verwendet

I. Schieferdecker, J. Grossmann: Testing of Embedded Control Systems with Continous Signals, 2nd Workshop on Modelling of Embedded Systems

Abstract:The systematic testing approaches developed within the telecommunication domain for conformance and interoperability testing of communication protocols have been extended and broadened to allow the testing of local and distributed, reactive and proactive systems in further domains such as Internet, IT, control systems in automotive, railways, avionics and alike. With the application of these testing principles it became apparent that the testing of systems with continuous systems is different to that of discrete systems. Although every continuous signal can be discretized by sampling methods (and hence mapped to the discrete signal paradigm), abstraction and performance issues in this setting become critical. This paper investigates the different options to support tests of embedded control systems in the framework of TTCN-3.

J. Zander, Z.R. Dai, I. Schieferdecker, G. Din: From U2TP Models to Executable Tests with TTCN-3 - An Approach to Model Driven Testing, IFIP 17th Intern. Conf. on Testing Communicating Systems - TestCom 2005

Abstract: The approach towards system engineering according to Model-Driven Architectures (MDA) with code generation derived from model implies also an increased need for research on automation of the test generation process. This paper presents an approach to derive executable tests from UML 2.0 Testing Profile diagrams automatically. In particular, an approach to derive executable tests within the Testing and Test Control Notation (TTCN-3) is discussed. The transformation rules between the source U2TP meta-model to the target TTCN-3 meta-model are given.